Family: DE VOS, Anthonie / BUSTRAAN, Adriana (F2558)

m. 6 May 1875


Family Information    |    Notes    |    Sources    |    All

  • Father | Male
    DE VOS, Anthonie

    Born  1828  Wemeldinge, Kapelle, Zeeland, Netherlands Find all individuals with events at this location
    Died  22 Apr 1899  Wemeldinge, Kapelle, Zeeland, Netherlands Find all individuals with events at this location
    Buried     
    Married  6 May 1875  [1]  Wemeldinge, Kapelle, Zeeland, Netherlands  [1] Find all individuals with events at this location
    Other Spouse  VAN VEEN, Cornelia | F2561 
    Married     
    Father  DE VOS, Pieter | F2559 Group Sheet 
    Mother  BREDOUW, Johanna | F2559 Group Sheet 

    BUSTRAAN, AdrianaMother | Female
    BUSTRAAN, Adriana

    Born  6 Sep 1843  Wemeldinge, Kapelle, Zeeland, Netherlands Find all individuals with events at this location
    Died  10 Jul 1916  Wemeldinge, Kapelle, Zeeland, Netherlands Find all individuals with events at this location
    Buried    Algemene Begraafplaats, Wemeldinge, Kapelle, Zeeland, Netherlands Find all individuals with events at this location
    Other Spouse  WISSE, Johannes | F2553 
    Married  27 Sep 1866  Kruiningen, Kruiningen, Zeeland, Netherlands Find all individuals with events at this location
    Other Spouse  DE SCHIPPER, Dirk | F2562 
    Married  3 May 1900  Wemeldinge, Kapelle, Zeeland, Netherlands Find all individuals with events at this location
    Father  BUSTRAAN, Anthonij | F2557 Group Sheet 
    Mother  DE RIJDER, Maria | F2557 Group Sheet 

  • Notes  Married:
    • Their marriage record states Anthonie is a 47 year old "arbeider" day laborer born in Wemeldinge, son of Pieter de Vos and Johanna Bredouw, and widower of Cornelia van Veen. Adriana is a 31 year old "arbeidster" female day laborer born in Wemeldinge, daughter of Anthonij Bustraan and Maria de Rijder a "arbeidster' female day laborer, and widow of Johannes Wisse.

  • Sources 
    1. [S5] Marriage Records Wemeldinge 1811 - 1934, Zeeland Archives., 6 May 1875 Act No. 5. (Reliability: 3).